MPI Automated Wafer Probe Systems

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Description

MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.

MPI TS2000 automated wafer probe systems
MPI TS2000-SE automated wafer probe systems with ShielDEnvironment
MPI TS2500-RF automated wafer probe systems for HF applications
MPI TS3000 automated wafer probe systems
MPI TS3000-SE automated wafer probe systems with ShielDEnvironment

Datasheets, Downloads, and Manuals

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